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Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
Umfang: IX, 146 S.
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Niknahad, M. 2013. Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.5445/KSP/1000035134
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Veröffentlicht am 18. Juli 2013
Englisch
160
| Paperback | 978-3-7315-0038-4 |