Spectral imaging in process analytics usingchemometrics and first principles
S. Luckow-Markward, E. Ostertag, B. Boldrini, W. Kessler, R. W. Kessler
Kapitel/Beitrag aus dem Buch: Längle, T et al. 2013. OCM 2013 – Optical Characterization of Materials – conference proceedings.