Kapitel/Beitrag aus dem Buch: Längle, T et al. 2013. OCM 2013 – Optical Characterization of Materials – conference proceedings.
The millimeter wave region up to the lower THz region
offers a good penetration ability for many dielectric materials
which are in use today. Especially for the quality control of foods
within its package, impurities can be clearly identified as long
as the package is free from any metallic material. Another field
of interest is the quality of welded-, brazed- and soldered joints.
The present paper describes the detection and characterization of
different materials under test by two different measurement systems.
An vector network analyzer and a “Stand Alone MilliMeter
wave Imager” called SAMMI developed by Fraunhofer FHR. For
the characterization the different materials will be detect with a
clustering algorithm in connection with the optimization of the
measured data with regard to the problem of ambiguous phase
values, called Phase Unwrapping. The permittivity of the different
clusters are determined by a reconstruction algorithm.
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Demming, M et al. 2013. Characterisation of materials in the millimeterwave frequency region for industrialapplications. In: Längle, T et al (eds.), OCM 2013 – Optical Characterization of Materials – conference proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.58895/ksp/1000032143-25
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Veröffentlicht am 6. März 2013