Kapitel/Beitrag aus dem Buch: Längle, T et al. 2015. OCM 2015 – 2nd International Conference on Optical Characterization of Materials, March 18th – 19th, 2015, Karlsruhe, Germany : Conference Proceedings.
This article describes design, hard- and software implementation
of devices and a workflow for acquisition, processing,
storage and analysis of multispectral material signatures. An
approach for a consistent process from measurement to analysis
is presented, utilizing standard formats for multi-dimensional
image data. Finally applications are demonstrated that make use
of the material signatures database.
Irgenfried S. & Hock J. 2015. Acquisition and storage ofmultispectral material signatures –Workflow design and implementation. In: Längle, T et al (eds.), OCM 2015 – 2nd International Conference on Optical Characterization of Materials, March 18th – 19th, 2015, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.58895/ksp/1000044906-10
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Veröffentlicht am 18. März 2015