• Part of
    Ubiquity Network logo
    Interesse beim KIT-Verlag zu publizieren? Informationen für Autorinnen und Autoren

    Lesen sie das Kapitel
  • No readable formats available
  • Hyperspectral imaging as process analysistechnology for inline applications – Laboratoryprecision meets high sampling accuracy

    Matthias Kerschhaggl

    Kapitel/Beitrag aus dem Buch: Längle, T et al. 2015. OCM 2015 – 2nd International Conference on Optical Characterization of Materials, March 18th – 19th, 2015, Karlsruhe, Germany : Conference Proceedings.

     Download

    Hyperspectral Imaging (HSI) has found its way into
    modern production lines as yet another camera technology that
    combines the means of spectroscopy with computer vision. However,
    while its imaging capabilities with its increased amount of
    processed data are already subject to state of the art sorting machines
    used for product integrity checks and foreign body removal,
    the potential of doing real-time spectroscopy and quantitative
    chemical analysis of product streams has up to now not
    fully been harnessed for the production line. Respective industries
    still rely solely on highly precise but statistically limited,
    laboratory based, slow and invasive methods while HSI offers
    the data needed to perform real-time and statistically representative
    product sampling as add on. In this regard the potential
    of HSI as process analysis technology (PAT) will be outlined in
    this article presenting a first industrial field application based on
    the HELIOS near infrared hyperspectral imaging camera. Results
    from this up to now first commercialized application of this kind
    in the potato industry, i.e. an inline dry matter detection for potatoes,
    will be discussed.

    :

    Empfohlene Zitierweise für das Kapitel/den Beitrag
    Kerschhaggl, M. 2015. Hyperspectral imaging as process analysistechnology for inline applications – Laboratoryprecision meets high sampling accuracy. In: Längle, T et al (eds.), OCM 2015 – 2nd International Conference on Optical Characterization of Materials, March 18th – 19th, 2015, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.58895/ksp/1000044906-22
    Lizenz

    This chapter distributed under the terms of the Creative Commons Attribution + ShareAlike 4.0 license. Copyright is retained by the author(s)

    Peer Review Informationen

    Dieses Buch ist Peer reviewed. Informationen dazu Hier finden Sie mehr Informationen zur wissenschaftlichen Qualitätssicherung der MAP-Publikationen.

    Weitere Informationen

    Veröffentlicht am 18. März 2015

    DOI
    https://doi.org/10.58895/ksp/1000044906-22