Hyperspectral imaging as process analysistechnology for inline applications – Laboratoryprecision meets high sampling accuracy
Matthias Kerschhaggl
Kapitel/Beitrag aus dem Buch: Längle, T et al. 2015. OCM 2015 – 2nd International Conference on Optical Characterization of Materials, March 18th – 19th, 2015, Karlsruhe, Germany : Conference Proceedings.