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  • Sensitivity and selectivity in optical spectroscopy and imaging: A molecular approach

    Rudolf W. Kessler

    Kapitel/Beitrag aus dem Buch: Längle, T et al. 2015. OCM 2015 – 2nd International Conference on Optical Characterization of Materials, March 18th – 19th, 2015, Karlsruhe, Germany : Conference Proceedings.

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    Intelligent manufacturing has attracted enormous interest in recent years. Optical spectroscopy will play a major role in the sensor technology as it provides simultaneously chemical (by absorption) and morphological (by scatter) information. The paper demonstrates, that the sensitivity and selectivity of each individual technology has its limitations due to the structure of the molecule and the quantum mechanical limitations by their interaction with the photons. The absorption and scatter cross sections are defined and discussed in terms of sensitivity and selectivity of the different technologies. These fundamentals cannot be overcome. Furthermore, the suitability and robustness of each technology is pre-determined by the selection of appropriate light illumination sources and the selected detectors. An overview of the different techniques is given.

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    Empfohlene Zitierweise für das Kapitel/den Beitrag
    Kessler, R. 2015. Sensitivity and selectivity in optical spectroscopy and imaging: A molecular approach. In: Längle, T et al (eds.), OCM 2015 – 2nd International Conference on Optical Characterization of Materials, March 18th – 19th, 2015, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.58895/ksp/1000044906-7
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    Veröffentlicht am 18. März 2015

    DOI
    https://doi.org/10.58895/ksp/1000044906-7