Sensitivity and selectivity in optical
spectroscopy and imaging: A molecular
approach
Rudolf W. Kessler
Kapitel/Beitrag aus dem Buch: Längle, T et al. 2015. OCM 2015 – 2nd International Conference on Optical Characterization of Materials, March 18th – 19th, 2015, Karlsruhe, Germany : Conference Proceedings.
Intelligent manufacturing has attracted enormous interest in recent years. Optical spectroscopy will play a major role
in the sensor technology as it provides simultaneously chemical
(by absorption) and morphological (by scatter) information. The
paper demonstrates, that the sensitivity and selectivity of each
individual technology has its limitations due to the structure of
the molecule and the quantum mechanical limitations by their
interaction with the photons. The absorption and scatter cross
sections are defined and discussed in terms of sensitivity and selectivity of the different technologies. These fundamentals cannot
be overcome. Furthermore, the suitability and robustness of each
technology is pre-determined by the selection of appropriate light
illumination sources and the selected detectors. An overview of
the different techniques is given.