Kapitel/Beitrag aus dem Buch: Beyerer J. & Längle T. 2021. OCM 2021 – 5th International Conference on Optical Characterization of Materials, March 17th – 18th, 2021, Karlsruhe, Germany : Conference Proceedings.
Recently emerged near-infrared (NIR) spectrometers
based on micro-electromechanical systems (MEMS) are a highly
compact, rugged and cost-efficient alternative to infrared spectrometers
conventionally used in industrial environments. The
majority of the devices currently available are designed for measurements
in diffuse reflection geometry in close contact with
the sample, with built-in low-power halogen light sources – usually
intended for consumer applications. However, for most
material characterization applications in the industrial environment
such a measurement configuration is neither feasible, nor
practical. Using light transmitting optical fibers in combination
with a measurement probe and a high power fiber-coupled light
source is often preferable. In this contribution we compare various
fiber-coupled NIR-spectrometers based on different MEMS
technologies and demonstrate the applicability of MEMS spectrometer
technology in industrial environments.
Zimmerleiter, R et al. 2021. Fiber-Coupled MEMS-based NIRSpectrometers for Material Characterization inIndustrial Environments. In: Beyerer J. & Längle T (eds.), OCM 2021 – 5th International Conference on Optical Characterization of Materials, March 17th – 18th, 2021, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.58895/ksp/1000128686-15
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Veröffentlicht am 17. März 2021