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  • MEMS based systems and their applications inNIR spectroscopy for materials analysis

    Heinrich Grüger, Tino Pügner, Jens Knobbe, Harald Schenk

    Kapitel/Beitrag aus dem Buch: Längle, T et al. 2013. OCM 2013 – Optical Characterization of Materials – conference proceedings.

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    Spectrometers and spectrographs based on scanning
    grating monochromators are well-established tools for various
    applications, for example analysis of organic matter. As new applications
    came into focus in the last few years, there is a demand
    for more miniaturized systems. The future spectroscopic
    devices should exhibit very small dimensions and low power
    consumption. A spectroscopic system with a volume of only
    (15 × 10 × 14) mm3 and a few milliwatts of power consumption,
    that has the potential to fulfill the demands of the upcoming mobile
    applications, has been developed. The approach is based on
    two major improvements. First, resonantly driven MEMS (micro
    electro mechanical systems) scanning grating chip, which provides
    also two integrated optical, slits and piezoresistive position
    detection has been used. Second, hybrid integration of optical
    components by highly sophisticated manufacturing technologies
    was applied. One objective is the combination of MEMS technology
    and a planar mounting approach, which potentially facilitate
    the mass production of spectroscopic systems and a significant
    reduction of cost per unit. The optical system design as well as
    the realization of a miniaturized scanning grating spectrometer
    for the near infrared (NIR) range between 950 nm and 1900 nm
    with a spectral resolution of 10 nm is presented. The MEMS devices
    as well as the optical components have been manufactured
    and first samples of the spectroscopic measurement device have
    been mounted by an automated die bonder. First application
    close measurements on organic matter have been performed and
    will be discussed.

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    Empfohlene Zitierweise für das Kapitel/den Beitrag
    Grüger, H et al. 2013. MEMS based systems and their applications inNIR spectroscopy for materials analysis. In: Längle, T et al (eds.), OCM 2013 – Optical Characterization of Materials – conference proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.58895/ksp/1000032143-2
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    Veröffentlicht am 6. März 2013

    DOI
    https://doi.org/10.58895/ksp/1000032143-2