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  • Material Characterization using a Compact Computed Tomography Imaging Spectrometer with Super-resolution Capability

    Simon Amann, Mazen Mel, Pietro Zanuttigh, Tobias Haist, Markus Kamm, Alexander Gatto

    Kapitel/Beitrag aus dem Buch: Beyerer, J et al. 2023. OCM 2023 - 6th International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2023, Karlsruhe, Germany : Conference Proceedings.

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    Computed Tomography Imaging Spectrometer (CTIS) systems are snapshot hyperspectral imaging devices capable of capturing dense spectra of static as well as dynamic scenes. A three-dimensional hyperspectral cube is smeared across the spatial dimension via Diffractive Optical Element (DOE) and projected across multiple angles forming a two-dimensional compressed sensor image. In this paper we demonstrate material characterization and classification capability of a compact CTIS system leveraging spectral signatures. Then we propose an approach to simultaneously reconstruct and segment into regions corresponding to different materials hyperspectral images with enhanced spatial resolution from CTIS sensor measurements.

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    Empfohlene Zitierweise für das Kapitel/den Beitrag
    Amann, S et al. 2023. Material Characterization using a Compact Computed Tomography Imaging Spectrometer with Super-resolution Capability. In: Beyerer, J et al (eds.), OCM 2023 - 6th International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2023, Karlsruhe, Germany : Conference Proceedings. Karlsruhe: KIT Scientific Publishing. DOI: https://doi.org/10.58895/ksp/1000155014-13
    Lizenz

    This is an Open Access chapter distributed under the terms of the Creative Commons Attribution 4.0 license (unless stated otherwise), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. Copyright is retained by the author(s).

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    Veröffentlicht am 25. Mai 2023

    DOI
    https://doi.org/10.58895/ksp/1000155014-13