Material Characterization using a Compact Computed Tomography Imaging Spectrometer with Super-resolution Capability
Simon Amann,
Mazen Mel,
Pietro Zanuttigh,
Tobias Haist,
Markus Kamm,
Alexander Gatto
Kapitel/Beitrag aus dem Buch: Beyerer, J et al. 2023. OCM 2023 - 6th International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2023, Karlsruhe, Germany : Conference Proceedings.
Computed Tomography Imaging Spectrometer (CTIS)
systems are snapshot hyperspectral imaging devices capable of
capturing dense spectra of static as well as dynamic scenes. A
three-dimensional hyperspectral cube is smeared across the spatial
dimension via Diffractive Optical Element (DOE) and projected
across multiple angles forming a two-dimensional compressed
sensor image. In this paper we demonstrate material
characterization and classification capability of a compact CTIS
system leveraging spectral signatures. Then we propose an approach
to simultaneously reconstruct and segment into regions
corresponding to different materials hyperspectral images with
enhanced spatial resolution from CTIS sensor measurements.