Suchen

Treffer: 3

• Monographie

  Development of NbN based Kinetic Inductance Detectors on sapphire and diamond substrates for fusion plasma polarimetric diagnostics

  Francesco Mazzocchi

  Buchdetails

• Sammelband

  OCM 2013 – Optical Characterization of Materials – conference proceedings

  Thomas Längle, Fernando Puente León, Jürgen Beyerer (eds.)

  Buchdetails

• Chapter from OCM 2023 - 6th International Conference on Optical Characterization of Materials, March 22nd – 23rd, 2023, Karlsruhe, Germany : Conference Proceedings

  Sensitivity enhanced glucose sensing by return-path Mueller matrix ellipsometry

  Jürgen Beyerer, Thomas Längle, Matthias Hartrumpf, Chia-Wei Chen

  Buchdetails