Suchen

Treffer: 2

• Monographie

  Data-driven Methods for Fault Localization in Process Technology

  Christian Kühnert

  Buchdetails

• Chapter from OCM 2013 – Optical Characterization of Materials – conference proceedings

  Spectral imaging in process analytics usingchemometrics and first principles

  R. W. Kessler, W. Kessler, B. Boldrini, E. Ostertag, S. Luckow-Markward

  Buchdetails